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Transistor model
Results: 80

#	Item
61	Compact model for ultra-short channel four-terminal DG MOSFETs for exploring circuit characteristics T. Nakagawa, T. Sekigawa, T. Tsutsumi, M. Hioki, E. Suzuki, and H. Koike Electroinformatics Group, Nanoelectronics Res Add to Reading List Source URL: www.nsti.org Language: English* - Date: 2005-05-23 13:18:26 Electrical engineering Transistor Short-channel effect Field-effect transistor Multigate device Depletion region Power electronics Power MOSFET Semiconductors Technology MOSFET Electronic engineering
62	WCM-MSM2003 Workshop on Compact Modeling The 6th International Conference on Modeling and Simulation of Microsystems (San Francisco, California, USA. February 25–27, 2003) Overview Add to Reading List Source URL: www.nsti.org Language: English - Date: 2010-03-19 15:24:04 Chenming Hu MOSFET Transistor model Compact Software Transistor Threshold voltage Bipolar junction transistor Silicon-germanium Multigate device Electrical engineering Electronic engineering Electromagnetism
63	Analog Design Tool based on the ACM model Carlos Galup-Montoro Márcio Cherem Schneider Cátia dos Reis Machado Add to Reading List Source URL: www.nsti.org Language: English - Date: 2005-05-23 13:16:40 Electromagnetism Transistor MOSFET Amplifier Electronic circuit Electronics Technology Electronic engineering
64	Microsoft PowerPoint[removed]Keynote A HistoryOfMOSTransistorCompactModelingSlidesXGAJPG88.ppt Add to Reading List Source URL: www.nsti.org Language: English - Date: 2010-03-19 15:55:06 Small-signal model Electrical engineering Technology Chih-Tang Sah Electronic engineering Transistor
65	ADVANCED COMPACT MOSFET (ACM) MODEL Self-Consistent DC, AC, Noise and Mismatch MOSFET Models for Circuit Design. Carlos Galup-Montoro Add to Reading List Source URL: www.nsti.org Language: English - Date: 2010-03-19 15:35:59 MOSFET Technology Flicker noise Field-effect transistor Threshold voltage Transistor Electronic design Channel length modulation Electrical engineering Electromagnetism Noise
66	CMOS RF Modeling and Parameter Extraction Approaches Taking Charge Conservation into Account April 24, 2002 Minkyu Je, Ickjin Kwon, Jeonghu Han, Add to Reading List Source URL: www.nsti.org Language: English - Date: 2010-03-19 15:18:49 Electrical circuits MOSFET CMOS Transistor model MICROS Systems Large-signal model Transistor Field-effect transistor MESFET Electronic engineering Electrical engineering Electronics
67	WCM2003 The 6th International Conference on Modeling and Simulation of Microsystems Grant Hyatt San Francisco, SF, USA Unified Length-/Width-Dependent Threshold Voltage Model Add to Reading List Source URL: www.nsti.org Language: English - Date: 2010-03-19 15:28:41 Field-effect transistor MOSFET Constructible universe Threshold voltage Capacitance Electromagnetism Physics Physical quantities
68	Microsoft PowerPoint - wcm05_niknejad.ppt Add to Reading List Source URL: www.nsti.org Language: English - Date: 2010-03-19 15:53:53 Electronic design MOSFET Transistor model CMOS Transistor BSIM Compact Software Field-effect transistor Amplifier Electronic engineering Electronics Electrical engineering
69	WCM-MSM2002 Workshop on Compact Modeling The 5th International Conference on Modeling and Simulation of Microsystems (San Juan, Puerto Rico, USA. April 23-25, 2002) As the mainstream MOS technology is scaled into the ve Add to Reading List Source URL: www.nsti.org Language: English - Date: 2010-03-19 15:17:56 BSIM Electronics Compact Software MOSFET Computer simulation MOS Technology EKV MOSFET Model Electronic engineering Electrical engineering Transistor model
70	On the correlations between model process parameters in statistical modeling Jiří Slezák, Aleš Litschmann, Stanislav Banáš, Radim Mlčoušek, Martin Kejhar SCG Czech Design Center, ON Semiconductor Czech Republic, Add to Reading List Source URL: www.nsti.org Language: English - Date: 2010-03-19 15:37:55 Statistical mechanics Statistics Process management Sensitivity analysis Monte Carlo method Bipolar junction transistor Statistical model Scientific modeling Science Probability and statistics

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